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    • PVA TePla America, LLC
    • 251 Corporate Terrace
      Corona, Ca 92879.

    SAM 400

    Sam 400 High Definition, High Dynamic Scanning Systems

    Advanced Dual Gantry Scanning System

    Stratum combines high throughput with advanced technical capability. Stratum is dedicated to industrial R&D with demand for high throughput. The extra high throughput is assured by a fast and stable dual gantry scanning system. Non destructive acoustic investigations using our new rf and transducer technology up to 500 MHz are implemented into Stratum for highest resolution at maximum speed.

    High Frequency Electronics

    The high scanning speed of the Stratum requires accurate synchronization of pulsing and detection. Sampling is performed at 7 GSamples and data processing is supported by time dependent gain (TDG). For high contrast and high signal to noise ratio Hilbert filters are used

    WINSAM 8, 64 Bit, Multi Channe

    The PVA TePla Analytical Systems proprietary graphical user interface, WINSAM 8, ensures that the powerful functionality of Stratum is easily applied. WINSAM 8 intuitively leads you through sampling, imaging and analysis / reporting.

    Up to 4 transducers can simultaneously scan for higher throughput. Multiple transducers can be used on a single substrate and the images then stitched together, or multiple transducers can simultaneously scan multiple substrates.

    WINSAM 8 Software performs complex analytical functions via a simplified and convenient interface. Transducers are adaptable to your application, customized design and manufacturing ensures precision. Proprietary Transducer Technology ensures best performance and accuracy

    • Products
      • SAM 300
      • SAM 400
      • Sam 1000 / 2000
      • Auto Wafer
      • SAM Autotray
      • Auto Ingot
    • Operation Principle
    • Frequency Range & Resolution
    • Applications
      • Semiconductior
      • Industrial
      • Life Science
    • Customization
    • Research Partners
    • Service and Support
    • Scaning Modes
    • A-Scan
    • B-Scan
    • P-Scan
    • C-Scan
    • X-Scan
    • G-Scan
    • D-Scan
    • Z-Scan
    • Through-Scan
    • T-Scan
    • ROT-Scan
    • V(z)-Scan