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    • PVA TePla America, LLC
    • 251 Corporate Terrace
      Corona, Ca 92879.

    Auto Tray

    The Auto Tray Automated Industrial Inspection

    Producing electronic devices, boards, IGBT’s and other complex components depends crucially on bonding, soldering and encapsulation. The Auto Tray allows for non-destructively inspecting devices for such failures.

    High throughput

    Main applications include detection of voids, inclusions, and delaminated areas in bonding interfaces and thickness variations in layer structures. These defects may occur in different layers of the device. In production high throughput is required, hence PVA TePla Analytical’s proprietary software supports the simultaneous inspection of several layers.

    Flexible Design

    The Auto Tray, the customized solution for inline process diagnostics and control, can be integrated in any production environment because it features:

    • Inline inspection for JEDEC-Trays
    • Clean room compatibility down to class 10
    • Integrated data analysis and automation
    • Software, fab communication by SECS interface
    • Degassing system for process water
    • Automatic water exchange with conductance monitoring

    • Products
      • SAM 300
      • SAM 400
      • Sam 1000 / 2000
      • Auto Wafer
      • SAM Autotray
      • Auto Ingot
    • Operation Principle
    • Frequency Range & Resolution
    • Applications
      • Semiconductior
      • Industrial
      • Life Science
    • Customization
    • Research Partners
    • Service and Support
    • Scaning Modes
      • A-Scan
      • B-Scan
      • P-Scan
      • C-Scan
      • X-Scan
      • G-Scan
      • D-Scan
      • Z-Scan
      • Through-Scan
      • T-Scan
      • ROT-Scan
      • V(z)-Scan