The applications laboratory at PVA TePla’s Corona, California facility is now equipped with a SAM 300 scanning acoustic microscope. PVA TePla Analytical Systems continues to identify customer requirements and is outstandingly creative and innovative. PVA TePla Analytical Systems’ scanning acoustic microscopes are ideally suited to applications such as:

– Nondestructive and fast examination of volume and structural defects in different materials.

– Displaying of nonhomogeneities, density differences, tensions, delaminations

– Layer-thickness measurement, reliability examination, judgment of material connections

– The confocal properties can be exploited to give enhanced depth resolution to examine individual interfaces.

Companies interested in testing our capabilities are welcome to use our facility free of charge. Determining analytical protocols is often an important prerequisite to a system purchase. Now PVA TePla can offer both hands-on experience with our SAM 300, or send parts directly to us and allow our team of experts develop test protocols for you. The SAM 300 is a dedicated high throughput, non destructive tool for quality and process control and research applications. It enables detailed acoustic investigations through new transducer technologies ranging from 3 MHz - 400 MHz and with an ultrasound frequency range up to 500 MHz. A graphical user interface ensures that the powerful functionality of SAM 300 is easily applied. Built to industry standards around a core platform that utilizes the latest production and research technology, the SAM 300 can accurately handle samples up to 320 mm x 320 mm x 45 mm (w/l/h).

SAM 300